56 results
The Effect of Mats on the Welfare of Sows and Piglets in the Farrowing House
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- Animal Welfare / Volume 9 / Issue 1 / February 2000
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- 11 January 2023, pp. 39-48
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Separation of EBIC Modes with Two-Channel STEM EBIC
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2508-2509
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- August 2022
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Determining the Polarization Fraction of Thin Film Ferroelectric HZO with STEM EBIC
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
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- 22 July 2022, pp. 2270-2271
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- August 2022
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Detecting Temperature-Induced Strain Changes using In Situ Transmission Kikuchi Diffraction
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
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- 22 July 2022, pp. 576-577
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- August 2022
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A Low-Noise, Two-Channel STEM EBIC Metrology System
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
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- 22 July 2022, pp. 794-795
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- August 2022
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In Situ Transmission Kikuchi Diffraction Observation of Thin-Film GST Crystal Phase and Grain Evolution
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
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- 22 July 2022, pp. 2314-2315
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- August 2022
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Technique and Computational Improvements in 4D STEM and Cross-Correlation Analysis
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
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- 30 July 2021, pp. 1540-1541
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- August 2021
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Chemical Shift Detection with Energy Dispersive Spectroscopy (EDS)
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
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- 30 July 2021, pp. 2068-2069
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- August 2021
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In Situ Visualization of the Electron Wind Force in the Elastic Regime
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 106-107
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- August 2021
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Imaging Soft and Hard Dielectric Breakdown in Resistive Switching
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 2354-2355
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- August 2021
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Modern STEM EBIC: Emerging Modes and Methods
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 2350-2352
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- August 2021
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In Situ STEM Observations of Elemental Segregation in Phase Change Material GST Under Electrical and Thermal Stress
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
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- 30 July 2021, pp. 168-169
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- August 2021
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Determining Lattice Parameters by Curve-Fitting Transmission Kikuchi Diffraction Patterns
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
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- 30 July 2021, pp. 2020-2021
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- August 2021
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Mean Angular Deviation Minimization To Determine Lattice Parameters in Transmission Kikuchi Diffraction
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1608-1609
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- August 2021
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Electrical Isolation Preserved by Plasma Focused Ion Beam TEM Sample Preparation and Verified with STEM SEEBIC Imaging
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 194-195
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- August 2020
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Fingerprinting the Phases of Thin Film Ge2Sb2Te5 with EELS
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 904-905
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- August 2020
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Nanoparticle Temperature Measurements for MEMS Heater Calibration
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
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- 30 July 2020, pp. 1226-1227
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- August 2020
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STEM EBIC Thermometry Calibration with PEET on Al Nanoparticles
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 3124-3125
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- August 2020
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Correlation of Joule Heating and Electromigration-induced Mass Transport within Nanoscale Co Interconnects by In Situ STEM
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 152-154
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- August 2020
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Total Electron Yield Mapping of Electronic Device Features via Measurement of X-Ray Beam-Induced Currents
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 256-257
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- August 2019
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